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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Autor R.F. Egerton
en Limba Engleză Hardback – 3 aug 2005
Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and "inner space." However, it will be equally valuable for technologists who make use of electron microscopes and for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy. Less technical but broader in scope than other microscopy textbooks, Physical Principles of Electron Microscopy is appropriate for undergraduates and technologists with limited mathematical training.
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Specificații

ISBN-13: 9780387258003
ISBN-10: 0387258000
Pagini: 202
Ilustrații: XII, 202 p. 122 illus.
Dimensiuni: 155 x 235 x 15 mm
Greutate: 1.06 kg
Ediția:1st ed. 2005. Corr. printing 2005
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

An Introduction to Microscopy.- Electron Optics.- The Transmission Electron Microscope.- TEM Specimens and Images.- The Scanning Electron Microscope.- Analytical Electron Microscopy.- Recent Developments.

Recenzii

From the reviews:
"This book comprises a concise introduction to the fundamental physical concepts of electron microscopy and related analytical techniques … . The concepts are well explained and illustrated, and in addition, the author offers a helpful introduction to microscopy, as a whole … . The text includes interesting historical tidbits and also alludes to more recent developments … . It is suitable for institutional or personal purchase." (Andreas Holzenburg, Microbiology Today, July, 2006)
"R.F. Egerton … has now written a short book for beginners on electron microscopy in general: Physical Principles of Electron Microscopy, an Introduction to TEM, SEM, and AEM[10]. … Extremely simple language is used throughout and newcomers to the subject will be grateful for this text, designed to accompany a one-semester undergraduate course." (P. W. Hawkes, Ultramicroscopy, Vol. 107 (54), 2007)

Textul de pe ultima copertă

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Caracteristici

Introduces the theory and current practice of electron microscopy Ideal for undergraduates and technologists with limited mathematical training Covers principles and techniques essential to materials science, the semiconductor industry, nanotechnology, and the biomedical and forensic sciences Leading author who received the Distinguished Physical Scientist Award of the Microscopical Society of America in 2004 Includes supplementary material: sn.pub/extras

Notă biografică

Ray Egerton is Professor Emeritus of Physics at the University of Alberta and at Portland State University. He serves as the Physical Sciences Editor for Micron, The International Research and Review Journal for Microscopy.

Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, Springer). His awards include the Presidential Science Award from the Microbeam Analysis Society, the Distinguished Scientist Award from the Microscopy Society of America, and the Frances Doane Award for service to the Microscopical Society of Canada. He is a fellow of the Royal Society of Canada.