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Process Variations and Probabilistic Integrated Circuit Design

Editat de Manfred Dietrich, Joachim Haase
en Limba Engleză Paperback – 25 ian 2014
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
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Specificații

ISBN-13: 9781489988607
ISBN-10: 1489988602
Pagini: 268
Ilustrații: XVI, 252 p.
Dimensiuni: 155 x 235 x 14 mm
Greutate: 0.38 kg
Ediția:2012
Editura: Springer
Colecția Springer
Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

Introduction.- Physical and Mathematical Fundamentals.- Examination of Process Parameter Variations.- Methods of Parameter Variations.- Consequences for Circuits Design and Case Studies.- Conclusion.

Textul de pe ultima copertă

Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process.  Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.
 
This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits.  Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. 
  • Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process;
  • Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design;
  • Describes critical effects of process variation using simple examples that can be reproduced by the reader.
 
 
 


Caracteristici

Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design Describes critical effects of process variation using simple examples that can be reproduced by the reader