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Resonant X-Ray Scattering in Correlated Systems: Springer Tracts in Modern Physics, cartea 269

Editat de Youichi Murakami, Sumio Ishihara
en Limba Engleză Hardback – 5 ian 2017
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.
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Specificații

ISBN-13: 9783662532256
ISBN-10: 3662532255
Pagini: 245
Ilustrații: VII, 241 p. 151 illus., 25 illus. in color.
Dimensiuni: 155 x 235 x 16 mm
Greutate: 0.53 kg
Ediția:1st ed. 2017
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Tracts in Modern Physics

Locul publicării:Berlin, Heidelberg, Germany

Cuprins

Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara).- Resonant X-ray scattering in 3d electron systems (H. Nakao).- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura).- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima).- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati).- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii).


Notă biografică

Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan.

Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan.

Textul de pe ultima copertă

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

Caracteristici

Up-to-date review on x-ray scattering and diffraction X-ray scattering studies of transition-metal oxides Contributions from internationally renowned experts Includes supplementary material: sn.pub/extras