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Robust Computing with Nano-scale Devices: Progresses and Challenges de Chao Huang

Robust Computing with Nano-scale Devices: Progresses and Challenges: Lecture Notes in Electrical Engineering, cartea 58

Editat de Chao Huang
en Limba Engleză Hardback – 26 mar 2010
Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.
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Specificații

ISBN-13: 9789048185399
ISBN-10: 9048185394
Pagini: 200
Ilustrații: VIII, 180 p.
Dimensiuni: 155 x 235 x 20 mm
Greutate: 0.45 kg
Ediția:2010
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria Lecture Notes in Electrical Engineering

Locul publicării:Dordrecht, Netherlands

Public țintă

Research

Cuprins

Fault Tolerant Nanocomputing.- Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics.- Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays.- Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics.- The Prospect and Challenges of CNFET Based Circuits: A Physical Insight.- Computing with Nanowires: A Self Assembled Neuromorphic Architecture.- Computational Opportunities and CAD for Nanotechnologies.

Textul de pe ultima copertă

Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic barriers to lithography. The quantum effects and increasing leakage power begin setting physical limits on continuous CMOS feature size shrinking.
The research advances of innovative nano-scale devices have created great opportunities to surpass the barriers faced by CMOS technology, which include nanowires, carbon nanotube transistors, programmable molecular switches, resonant tunneling diodes, quantum dots, etc.
However, the success of many nanotechnologies relies on the self-assembly fabrication process to fabricate circuits. The stochastic self-assembly fabrication, unfortunately, has low reliability with defect densities several orders of magnitude higher than conventional CMOS technology.
Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.

Caracteristici

It addresses the most critical issues for nano-computing It presents the latest research achievements It covers different design levels It provides comprehensive solutions and accurate models It initiates promising future research directions Includes supplementary material: sn.pub/extras