Scanning Force Microscopy of Polymers: Springer Laboratory
Autor G. Julius Vancso, Holger Schönherren Limba Engleză Hardback – 17 mai 2010
Toate formatele și edițiile | Preț | Express |
---|---|---|
Paperback (1) | 584.01 lei 39-44 zile | |
Springer Berlin, Heidelberg – 23 aug 2016 | 584.01 lei 39-44 zile | |
Hardback (1) | 643.34 lei 3-5 săpt. | |
Springer Berlin, Heidelberg – 17 mai 2010 | 643.34 lei 3-5 săpt. |
Din seria Springer Laboratory
- Preț: 383.93 lei
- 18% Preț: 783.05 lei
- 15% Preț: 645.47 lei
- Preț: 394.29 lei
- Preț: 384.86 lei
- 15% Preț: 642.18 lei
- 18% Preț: 785.11 lei
- Preț: 384.48 lei
- 15% Preț: 642.51 lei
- 15% Preț: 645.60 lei
- 15% Preț: 660.49 lei
- 15% Preț: 642.51 lei
- 18% Preț: 953.65 lei
- 18% Preț: 895.76 lei
- 15% Preț: 645.79 lei
- Preț: 389.49 lei
- 15% Preț: 644.30 lei
- Preț: 385.84 lei
- 15% Preț: 580.46 lei
Preț: 643.34 lei
Preț vechi: 756.86 lei
-15% Nou
Puncte Express: 965
Preț estimativ în valută:
123.16€ • 128.51$ • 103.24£
123.16€ • 128.51$ • 103.24£
Carte disponibilă
Livrare economică 20 februarie-06 martie
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9783642012303
ISBN-10: 3642012302
Pagini: 264
Ilustrații: XIV, 248 p.
Dimensiuni: 155 x 235 x 20 mm
Greutate: 0.5 kg
Ediția:2010
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Laboratory
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642012302
Pagini: 264
Ilustrații: XIV, 248 p.
Dimensiuni: 155 x 235 x 20 mm
Greutate: 0.5 kg
Ediția:2010
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Laboratory
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
Principles: Theory and Practice.- Physical Principles of Scanning Probe Microscopy Imaging.- Atomic Force Microscopy in Practice.- Case Studies: Macromolecules, Polymer Morphology and Polymer Surface Properties by AFM.- Visualization of Macromolecules and Polymer Morphology.- Polymer Surface and Interface Properties and (Dynamic) Processes.
Recenzii
From the reviews:
“Atomic force microscopy (AFM) can be used to image polymer surfaces over a broad range from several nanometers to more than 100 micrometer scan sizes. … one of the most engaging and practical books ever on the topic of AFMs. It provides the reader with insightful methods for imaging polymer surfaces at elevated temperatures and in other situations. … would be suitable for both industrial researchers and academic personnel working in the laboratory. … Anyone who uses an AFM will find this book extremely useful.” (IEEE Electrical Insulation Magazine, Vol. 27 (4), July/August, 2011)
“Atomic force microscopy (AFM) can be used to image polymer surfaces over a broad range from several nanometers to more than 100 micrometer scan sizes. … one of the most engaging and practical books ever on the topic of AFMs. It provides the reader with insightful methods for imaging polymer surfaces at elevated temperatures and in other situations. … would be suitable for both industrial researchers and academic personnel working in the laboratory. … Anyone who uses an AFM will find this book extremely useful.” (IEEE Electrical Insulation Magazine, Vol. 27 (4), July/August, 2011)
Caracteristici
A practice oriented book. It "teaches" the reader to pick up knowledge and skills necessary to obtain good and reliable results within the shortest possible time Didactically clear and easily understandable and contains many graphical representations and visuals Helps the reader to develop a conscious and critical understanding Includes supplementary material: sn.pub/extras