Cantitate/Preț
Produs

Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy: Springer Laboratory

Autor K. C. Khulbe, C. Y. Feng, Takeshi Matsuura
en Limba Engleză Hardback – 17 dec 2007
Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. Te development of membranes of improved performance depends on the exact kn- ledge of the morphology of a thin selective layer that exists at the surface of the m- brane. Te control of the morphology of the selective layer is crucial for the design of synthetic polymeric membranes. With a relatively short history of only twen- ?ve years, AFM has ?rmly established its position as a method to characterize the membrane surface. Each chapter of this book includes information on basic principles, commercial applications, current research, and guidelines for future research. Each chapter is summarized at the end and contains a comprehensive list of references. Te introductory chapter gives a brief overview of synthetic polymeric m- branes and their applications both in industrial processes and in biomedical ?elds. It also gives an overview of studies on membrane surface morphology by various methods. Chapter ? deals with the synthesis of membranes, the properties of membranes, and the application of membranes. Te beginning also identi?es the three types of membranes (i.e., biological, synthetic, and theoretical) and their applications.
Citește tot Restrânge

Toate formatele și edițiile

Toate formatele și edițiile Preț Express
Paperback (1) 80030 lei  6-8 săpt.
  Springer Berlin, Heidelberg – 22 noi 2010 80030 lei  6-8 săpt.
Hardback (1) 61822 lei  6-8 săpt.
  Springer Berlin, Heidelberg – 17 dec 2007 61822 lei  6-8 săpt.

Din seria Springer Laboratory

Preț: 61822 lei

Preț vechi: 72731 lei
-15% Nou

Puncte Express: 927

Preț estimativ în valută:
11832 12482$ 9860£

Carte tipărită la comandă

Livrare economică 02-16 ianuarie 25

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9783540739937
ISBN-10: 3540739939
Pagini: 216
Ilustrații: XVIII, 198 p. 146 illus.
Dimensiuni: 155 x 235 x 17 mm
Greutate: 0.48 kg
Ediția:2008
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Laboratory

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

Synthetic Membranes for Membrane Processes.- Atomic Force Microscopy.- Nodular Structure of Polymers in the Membrane.- Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface.- Cross-sectional AFM Image.- Adhesion.- Membrane Surface Morphology and Membrane Performance.

Recenzii

From the reviews:
"This latest addition to the Springer Laboratory series provides a good overview of membrane technology and the application of atomic force microscopy (AFM) in membrane characterization. It is easy to read … . In summary, this book presents a good introduction to the field of membrane science and technology. It will be of interest to both academics and industrialists involved in the use of membranes in separation processes and will be particularly welcomed by experimentalists who wish to become involved in AFM." (Peter A. Williams, Materials Today, Vol. 11 (5), May, 2008)

Caracteristici

First book which combines both fields AFM and Synthetic Membranes Will provide a very useful guide to the readers who wish to enter the subject of the book Gives details of AFM experimental methods and interpretation of experimental data Includes supplementary material: sn.pub/extras