Solid State Imaging: NATO Science Series E:, cartea 16
Editat de P. Jespers, F. van de Wiele, M.H. Whiteen Limba Engleză Paperback – 9 noi 2011
Din seria NATO Science Series E:
- 24% Preț: 1570.65 lei
- Preț: 397.76 lei
- Preț: 386.81 lei
- 20% Preț: 346.24 lei
- Preț: 424.33 lei
- 18% Preț: 1224.18 lei
- 18% Preț: 1836.63 lei
- 18% Preț: 1229.28 lei
- Preț: 381.00 lei
- Preț: 409.30 lei
- 18% Preț: 1841.36 lei
- 5% Preț: 367.28 lei
- Preț: 407.19 lei
- 18% Preț: 1838.38 lei
- Preț: 420.28 lei
- Preț: 399.29 lei
- Preț: 398.74 lei
- 18% Preț: 3026.13 lei
- Preț: 388.90 lei
- 5% Preț: 391.06 lei
- 18% Preț: 1228.62 lei
- 18% Preț: 1229.73 lei
- 18% Preț: 1234.46 lei
- 5% Preț: 3532.05 lei
- 18% Preț: 1840.11 lei
- 5% Preț: 378.80 lei
- 18% Preț: 1227.84 lei
- Preț: 392.75 lei
- Preț: 395.63 lei
- 18% Preț: 2489.30 lei
- 5% Preț: 1429.27 lei
- Preț: 396.02 lei
- 5% Preț: 2142.61 lei
- 18% Preț: 3049.16 lei
- 18% Preț: 1844.54 lei
- Preț: 403.53 lei
Preț: 414.30 lei
Nou
Puncte Express: 621
Preț estimativ în valută:
79.29€ • 82.46$ • 66.35£
79.29€ • 82.46$ • 66.35£
Carte tipărită la comandă
Livrare economică 15-29 martie
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9789401015363
ISBN-10: 9401015368
Pagini: 752
Ilustrații: 745 p. 57 illus.
Dimensiuni: 155 x 235 x 39 mm
Greutate: 1.03 kg
Ediția:Softcover reprint of the original 1st ed. 1976
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria NATO Science Series E:
Locul publicării:Dordrecht, Netherlands
ISBN-10: 9401015368
Pagini: 752
Ilustrații: 745 p. 57 illus.
Dimensiuni: 155 x 235 x 39 mm
Greutate: 1.03 kg
Ediția:Softcover reprint of the original 1st ed. 1976
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria NATO Science Series E:
Locul publicării:Dordrecht, Netherlands
Public țintă
ResearchCuprins
Section I: Introduction.- History of Solid-State Imaging.- Solid-State Imaging Applications.- Section II: Physics of Photosensors.- Anti-reflection Films and Multilayer Structures.- Photodiode Quantum Efficiency.- Bulk Trapping.- Surface Trapping.- Section III: Diode and Transistor Arrays.- Charge Storage Operation of Silicon Photodetectors.- XY Addressing.- Photodiode Sensor Arrays.- Phototransistor Arrays.- Section IV: CTD Arrays.- Charge Integration and Storage in MOS Photosensors.- to Charge-Coupled Devices.- Organization of Charge-Coupled Image Sensors.- Charge Transport without Traps.- Charge Transport with Traps.- Image Sensors Using Surface Channel Charge-Coupled Devices.- Buried Channel CCD’s.- Peristaltic Charge-Coupled Devices.- Electrical Charge Injection into CCD’s.- Section V: CID Arrays.- Charge-Injection Devices for Solid State Imaging.- Three-Terminal Charge-Injection Device.- Section VI: Signal Extraction.- Design of Solid-State Imaging Arrays.- Interlacing in Solid-State Image Sensors.- Amplifier and Amplifier Noise Considerations.- Principles of Low-Noise Signal Extraction from Photodiode Arrays.- Distributed Floating Gate Amplifier.- Fixed Pattern Noise and Cooled Photosensor Arrays.- Section VII: Systems.- Aliasing and MTF Effects in Photosensor Arrays.- Signal and Noise in the Display of Images.- Time Delay and Integration Image Sensors.- Solid State Infrared Imaging.- Low Light Level Performance of Charge-Coupled Area Imaging Devices.- Comparison of Solid-State Imagers and Electron Beam Scanning Imagers.- List of Participants.