X-ray and Neutron Reflectivity: Principles and Applications: Lecture Notes in Physics, cartea 770
Editat de Jean Daillant, Alain Gibauden Limba Engleză Hardback – 21 noi 2008
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Springer Berlin, Heidelberg – 22 oct 2010 | 376.69 lei 38-44 zile | |
Springer Berlin, Heidelberg – 23 aug 2014 | 383.74 lei 6-8 săpt. | |
Hardback (1) | 395.05 lei 6-8 săpt. | |
Springer Berlin, Heidelberg – 21 noi 2008 | 395.05 lei 6-8 săpt. |
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Specificații
ISBN-13: 9783540885870
ISBN-10: 3540885870
Pagini: 386
Ilustrații: XIV, 350 p.
Dimensiuni: 156 x 235 x 27 mm
Greutate: 0.77 kg
Ediția:2009
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Lecture Notes in Physics
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3540885870
Pagini: 386
Ilustrații: XIV, 350 p.
Dimensiuni: 156 x 235 x 27 mm
Greutate: 0.77 kg
Ediția:2009
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Lecture Notes in Physics
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
The Interaction of X-Rays (and Neutrons) with Matter.- Statistical Aspects of Wave Scattering at Rough Surfaces.- Specular Reflectivity from Smooth and Rough Surfaces.- Diffuse Scattering.- Neutron Reflectometry.- X-Ray Reflectivity by Rough Multilayers.- Grazing Incidence Small-Angle X-Ray Scattering from Nanostructures.
Textul de pe ultima copertă
This book is the first comprehensive introduction to X-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction on the interaction of X-rays and neutrons with matter, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next , in chapters 3 and 4 . The approximations are rigorously introduced and many experimental effects are discussed. The specific aspects of neutron reflectivity require separate treatment, given in chapter 5. Chapter 6 turns to X-ray reflectivity by rough multilayers. Eventually, chapter 7 introduces and discusses the by now well-established method of grazing incidence small angle X-ray scattering to investigate nanostructures.
For the second edition, the material has been completely reorganized so as to meet the demand for a modern multi-author textbook for PhD students and young researchers. All chapters have further been throughly revised, updated and, where appropriate, suitably augmented.
The first edition was been published as Lect. Notes Phys. m58 in the same series.
For the second edition, the material has been completely reorganized so as to meet the demand for a modern multi-author textbook for PhD students and young researchers. All chapters have further been throughly revised, updated and, where appropriate, suitably augmented.
The first edition was been published as Lect. Notes Phys. m58 in the same series.
Caracteristici
Includes supplementary material: sn.pub/extras