Cantitate/Preț
Produs

Acoustic Scanning Probe Microscopy: NanoScience and Technology

Editat de Francesco Marinello, Daniele Passeri, Enrico Savio
en Limba Engleză Paperback – 9 noi 2014
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.
Citește tot Restrânge

Toate formatele și edițiile

Toate formatele și edițiile Preț Express
Paperback (1) 63817 lei  6-8 săpt.
  Springer Berlin, Heidelberg – 9 noi 2014 63817 lei  6-8 săpt.
Hardback (1) 64152 lei  6-8 săpt.
  Springer Berlin, Heidelberg – 4 oct 2012 64152 lei  6-8 săpt.

Din seria NanoScience and Technology

Preț: 63817 lei

Preț vechi: 75079 lei
-15% Nou

Puncte Express: 957

Preț estimativ în valută:
12213 12686$ 10145£

Carte tipărită la comandă

Livrare economică 03-17 februarie 25

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9783642430794
ISBN-10: 3642430791
Pagini: 520
Ilustrații: XXVI, 494 p.
Dimensiuni: 155 x 235 x 27 mm
Greutate: 0.72 kg
Ediția:2013
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria NanoScience and Technology

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

From the contents: Overview of acoustic techniques.- Contact dynamics modelling.- Cantilever dynamics: theoretical modeling.- Finite elements modelling.- AFAM calibration.- Enhanced sensitivity.- UAFM.- Holography calibration.- UFM.- Friction/lateral techniques.- Harmonix.- Scanning microdeformation microscopy (SMM).- Tip wear.- Comparison with other techniques.- Applications polymer.- Thin films.

Textul de pe ultima copertă

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Caracteristici

Presents the new analytical technique of acoustic scanning probe microscopy Delivers a comprehensive presentation of all related technical aspects Compares the advantages of this new technique with other established scanning probe techniques Includes supplementary material: sn.pub/extras