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Applied Measurement with jMetrik

Autor J. Patrick Meyer
en Limba Engleză Paperback – 25 iun 2014
jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.
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Specificații

ISBN-13: 9780415531979
ISBN-10: 0415531977
Pagini: 170
Ilustrații: 55 black & white illustrations, 4 black & white tables, 19 black & white line drawings
Dimensiuni: 152 x 229 x 15 mm
Greutate: 0.29 kg
Ediția:New.
Editura: Taylor & Francis
Colecția Routledge
Locul publicării:Oxford, United Kingdom

Cuprins

Preface. Acknowledgements. Chapter 1: Data Management. Chapter 2: Item Scoring. Chapter 3: Test Scaling. Chapter 4: Item Analysis. Chapter 5: Reliability. Chapter 6: Differential Item Functioning. Chapter 7: Rasch Measurement. Chapter 8: Polytomous Rasch Models. Chapter 9: Plotting Item and Test Characteristics. Chapter 10: IRT Scale Linking and Score Equating. References. Appendix

Notă biografică

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia

Descriere

Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.