Circuit Design on Plastic Foils: Analog Circuits and Signal Processing
Autor Daniele Raiteri, Eugenio Cantatore, Arthur van Roermunden Limba Engleză Hardback – 15 dec 2014
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Paperback (1) | 608.95 lei 6-8 săpt. | |
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Specificații
ISBN-13: 9783319114262
ISBN-10: 3319114263
Pagini: 130
Ilustrații: X, 130 p. 103 illus., 53 illus. in color.
Dimensiuni: 155 x 235 x 15 mm
Greutate: 0.38 kg
Ediția:2015
Editura: Springer International Publishing
Colecția Springer
Seria Analog Circuits and Signal Processing
Locul publicării:Cham, Switzerland
ISBN-10: 3319114263
Pagini: 130
Ilustrații: X, 130 p. 103 illus., 53 illus. in color.
Dimensiuni: 155 x 235 x 15 mm
Greutate: 0.38 kg
Ediția:2015
Editura: Springer International Publishing
Colecția Springer
Seria Analog Circuits and Signal Processing
Locul publicării:Cham, Switzerland
Public țintă
ResearchCuprins
Introduction.- Applications of large-area electronics on foils.- State of the art in circuit design.- Device modeling and characterization.- Sensor frontend architecture.- Circuit design for analog signal conditioning.- Circuit design for data conversion.- Circuit design for digital processing.- Conclusions.
Textul de pe ultima copertă
This book illustrates a variety of circuit designs on plastic foils and provides all the information needed to undertake successful designs in large-area electronics. The authors demonstrate architectural, circuit, layout, and device solutions and explain the reasons and the creative process behind each. Readers will learn how to keep under control large-area technologies and achieve robust, reliable circuit designs that can face the challenges imposed by low-cost low-temperature high-throughput manufacturing.
• Discusses implications of problems associated with large-area electronics and compares them to standard silicon;
• Provides the basis for understanding physics and modeling of disordered material;
• Includes guidelines to quickly setup the basic CAD tools enabling efficient and reliable designs;
• Illustrates practical solutions to cope with hard/soft faults, variability, mismatch, aging and bias stress at architecture, circuit, layout, and device levels.
• Discusses implications of problems associated with large-area electronics and compares them to standard silicon;
• Provides the basis for understanding physics and modeling of disordered material;
• Includes guidelines to quickly setup the basic CAD tools enabling efficient and reliable designs;
• Illustrates practical solutions to cope with hard/soft faults, variability, mismatch, aging and bias stress at architecture, circuit, layout, and device levels.
Caracteristici
Discusses implications of problems associated with large-area electronics and compares them to standard silicon Provides the basis for understanding physics and modeling of disordered material Includes guidelines to quickly setup the basic CAD tools enabling efficient and reliable designs Illustrates practical solutions to cope with hard/soft faults, variability, mismatch, aging and bias stress at architecture, circuit, layout, and device levels Includes supplementary material: sn.pub/extras