Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration Analog Circuits and Signal Processing Autor Amir Zjajo et al. 5 noi 2010 Hardback Preț: 396.62 lei 43-57 zile
Integrated Circuit Defect-Sensitivity: Theory and Computational Models The Springer International Series in Engineering and Computer Science, nr. 208 Autor José Pineda de Gyvez 31 dec 1992 Hardback Preț: 641.71 lei 754.95 lei 43-57 zile -15%
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Frontiers in Electronic Testing, nr. 34 Autor Manoj Sachdev et al. 10 noi 2010 Paperback Preț: 1219.46 lei 1487.15 lei 43-57 zile -18%