Frontiers in Electronic Testing

Testability Concepts for Digital ICs: The Macro Test Approach

Frontiers in Electronic Testing, nr. 3

Autor F.P.M. Beenker et al.

30 noi 1995

Preț: 947^.35 lei 1155^.30 lei

6-8 săpt.

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Efficient Branch and Bound Search with Application to Computer-Aided Design

Frontiers in Electronic Testing, nr. 4

Autor Xinghao Chen et al.

31 dec 1995

Preț: 640^.06 lei 753^.01 lei

6-8 săpt.

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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

30 apr 1996

Preț: 640^.37 lei 753^.39 lei

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-15%

Frontiers in Electronic Testing, nr. 7

Editat de Yervant Zorian

4 oct 2012

Preț: 556^.09 lei 695^.11 lei

39-44 zile

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Frontiers in Electronic Testing, nr. 8

Autor S. Chakravarty et al.

30 iun 1997

Preț: 653^.79 lei 769^.17 lei

6-8 săpt.

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Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques

Frontiers in Electronic Testing, nr. 9

Autor Wolfgang Kunz et al.

30 iun 1997

Preț: 990^.95 lei 1238^.69 lei

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Frontiers in Electronic Testing, nr. 11

Editat de Michael Nicolaidis et al.

6 dec 2010

Preț: 639^.25 lei 752^.06 lei

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Formal Equivalence Checking and Design Debugging

Frontiers in Electronic Testing, nr. 12

Autor Shi-Yu Huang et al.

30 iun 1998

Preț: 1110^.24 lei 1353^.95 lei

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Research Perspectives and Case Studies in System Test and Diagnosis

Frontiers in Electronic Testing, nr. 13

Editat de John W. Sheppard et al.

30 sep 1998

Preț: 948^.47 lei 1156^.67 lei

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Frontiers in Electronic Testing, nr. 14

Autor Angela Krstic et al.

31 oct 1998

Preț: 946^.55 lei 1154^.34 lei

6-8 săpt.

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Design for AT-Speed Test, Diagnosis and Measurement

Frontiers in Electronic Testing, nr. 15

Editat de Benoit Nadeau-Dostie

30 sep 1999

Preț: 952^.72 lei 1161^.85 lei

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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 16

Editat de Adam Osseiran

31 oct 1999

Preț: 944^.82 lei 1152^.22 lei

6-8 săpt.

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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Frontiers in Electronic Testing, nr. 17

Autor M. Bushnell et al.

7 apr 2013

Preț: 808^.75 lei 986^.29 lei

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Frontiers in Electronic Testing, nr. 18

Autor José T. de Sousa et al.

28 feb 2001

Preț: 945^.79 lei 1153^.39 lei

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A Designer’s Guide to Built-In Self-Test

Frontiers in Electronic Testing, nr. 19

Autor Charles E. Stroud

31 mai 2002

Preț: 1226^.24 lei 1495^.42 lei

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Test Resource Partitioning for System-on-a-Chip

Frontiers in Electronic Testing, nr. 20

Autor Vikram Iyengar et al.

30 iun 2002

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Frontiers in Electronic Testing, nr. 21

Autor R. Bartl et al.

Preț: 648^.99 lei 683^.15 lei

Indisponibil temporar

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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Frontiers in Electronic Testing, nr. 21

Autor Krishnendu Chakrabarty

30 sep 2002

Preț: 649^.87 lei 764^.55 lei

6-8 săpt.

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 22B

Autor Nicola Nicolici et al.

28 feb 2003

Preț: 642^.51 lei 755^.88 lei

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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Frontiers in Electronic Testing, nr. 22A

Autor R. Dean Adams

26 apr 2013

Preț: 943^.07 lei 1150^.09 lei

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Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Frontiers in Electronic Testing, nr. 23

Editat de Alfredo Benso et al.

31 oct 2003

Preț: 948^.61 lei 1156^.84 lei

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Elements of STIL: Principles and Applications of IEEE Std. 1450

Frontiers in Electronic Testing, nr. 24

Autor Gregory A. Maston et al.

31 oct 2003

Preț: 953^.65 lei 1162^.99 lei

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Verification by Error Modeling: Using Testing Techniques in Hardware Verification

Frontiers in Electronic Testing, nr. 25

Autor Katarzyna Radecka et al.

30 noi 2003

Preț: 645^.14 lei 758^.99 lei

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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Frontiers in Electronic Testing, nr. 26

Autor Said Hamdioui

31 mar 2004

Preț: 644^.30 lei 758^.01 lei

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Advances in Electronic Testing: Challenges and Methodologies

Frontiers in Electronic Testing, nr. 27

Editat de Dimitris Gizopoulos

5 dec 2014

Preț: 951^.29 lei 1160^.10 lei

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Frontiers in Electronic Testing, nr. 28

Autor Dimitris Gizopoulos et al.

20 dec 2004

Preț: 990^.30 lei 1237^.87 lei

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Introduction to Advanced System-on-Chip Test Design and Optimization

Frontiers in Electronic Testing, nr. 29

Autor Erik Larsson

7 noi 2005

Preț: 968^.03 lei 1180^.52 lei

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Fault Diagnosis of Analog Integrated Circuits

Frontiers in Electronic Testing, nr. 30

Autor Prithviraj Kabisatpathy et al.

7 noi 2005

Preț: 642^.51 lei 755^.88 lei

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Frontiers in Electronic Testing, nr. 31

Autor Leendert M. Huisman

21 iun 2005

Preț: 646^.11 lei 760^.13 lei

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Fault-Tolerance Techniques for SRAM-Based FPGAs

Frontiers in Electronic Testing, nr. 32

Autor Fernanda Lima Kastensmidt et al.

14 iun 2006

Preț: 641^.85 lei 755^.13 lei

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Digital Timing Measurements: From Scopes and Probes to Timing and Jitter

Frontiers in Electronic Testing, nr. 33

Autor Wolfgang Maichen

11 aug 2006

Preț: 950^.96 lei 1159^.71 lei

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing, nr. 34

Autor Manoj Sachdev et al.

10 noi 2010

Preț: 1219^.46 lei 1487^.15 lei

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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500™

Frontiers in Electronic Testing, nr. 35

Autor Francisco da Silva et al.

20 oct 2014

Preț: 697^.47 lei 820^.55 lei

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Oscillation-Based Test in Mixed-Signal Circuits

Frontiers in Electronic Testing, nr. 36

Autor Gloria Huertas Sánchez et al.

6 noi 2006

Preț: 959^.04 lei 1169^.56 lei

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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability

Frontiers in Electronic Testing, nr. 37

Editat de Mohammad Tehranipoor

10 dec 2007

Preț: 958^.25 lei 1168^.60 lei

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Timing Performance of Nanometer Digital Circuits Under Process Variations

Frontiers in Electronic Testing, nr. 39

Autor Victor Champac et al.

27 apr 2018

Preț: 728^.28 lei 888^.14 lei

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Frontiers in Electronic Testing, nr. 40

Autor Andrei Pavlov et al.

21 iun 2008

Preț: 1001^.02 lei 1220^.75 lei

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Soft Errors in Modern Electronic Systems

Frontiers in Electronic Testing, nr. 41

Editat de Michael Nicolaidis

5 noi 2012

Preț: 787^.77 lei 1036^.54 lei

39-44 zile

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Frontiers in Electronic Testing, nr. 42

Autor Michael Gössel et al.

9 mai 2008

Preț: 641^.53 lei 754^.74 lei

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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault

Frontiers in Electronic Testing, nr. 43

Editat de Hans-Joachim Wunderlich

mar 2012

Preț: 644^.33 lei 805^.41 lei

6-8 săpt.

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Frontiers in Electronic Testing