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Oscillation-Based Test in Mixed-Signal Circuits: Frontiers in Electronic Testing, cartea 36

Autor Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, Jose Luis Huertas Díaz
en Limba Engleză Hardback – 6 noi 2006
Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
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Specificații

ISBN-13: 9781402053146
ISBN-10: 1402053142
Pagini: 468
Ilustrații: XVI, 452 p.
Dimensiuni: 155 x 235 x 31 mm
Greutate: 0.84 kg
Ediția:2006
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria Frontiers in Electronic Testing

Locul publicării:Dordrecht, Netherlands

Public țintă

Professional/practitioner

Cuprins

Oscillation-Based Test Methodology.- Mathematical Review of Non-linear Oscillators.- OBT Methodology for Discrete-Time Filters.- OBT Methodology for discrete-time ?? Modulators.- OBT Implementation in Discrete-Time Filters.- Practical regards for OBT-OBIST implementation.- OBT-OBIST silicon validation.

Notă biografică

Prof. José Luis Huertas is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, that published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.