Frontiers in Electronic Testing

Testability Concepts for Digital ICs: The Macro Test Approach

Frontiers in Electronic Testing, nr. 3

Autor F.P.M. Beenker et al.

30 noi 1995

Preț: 920^.17 lei 1122^.16 lei

43-57 zile

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Efficient Branch and Bound Search with Application to Computer-Aided Design

Frontiers in Electronic Testing, nr. 4

Autor Xinghao Chen et al.

31 dec 1995

Preț: 621^.74 lei 731^.45 lei

43-57 zile

-15%

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

30 apr 1996

Preț: 622^.04 lei 731^.82 lei

43-57 zile

-15%

Frontiers in Electronic Testing, nr. 7

Editat de Yervant Zorian

4 oct 2012

Preț: 556^.08 lei 695^.10 lei

38-44 zile

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Frontiers in Electronic Testing, nr. 8

Autor S. Chakravarty et al.

30 iun 1997

Preț: 635^.07 lei 747^.15 lei

43-57 zile

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Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques

Frontiers in Electronic Testing, nr. 9

Autor Wolfgang Kunz et al.

30 iun 1997

Preț: 962^.49 lei 1203^.12 lei

43-57 zile

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Frontiers in Electronic Testing, nr. 11

Editat de Michael Nicolaidis et al.

6 dec 2010

Preț: 620^.96 lei 730^.54 lei

43-57 zile

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Formal Equivalence Checking and Design Debugging

Frontiers in Electronic Testing, nr. 12

Autor Shi-Yu Huang et al.

30 iun 1998

Preț: 1078^.35 lei 1315^.06 lei

43-57 zile

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Research Perspectives and Case Studies in System Test and Diagnosis

Frontiers in Electronic Testing, nr. 13

Editat de John W. Sheppard et al.

30 sep 1998

Preț: 921^.25 lei 1123^.47 lei

43-57 zile

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Frontiers in Electronic Testing, nr. 14

Autor Angela Krstic et al.

31 oct 1998

Preț: 919^.38 lei 1121^.20 lei

43-57 zile

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Design for AT-Speed Test, Diagnosis and Measurement

Frontiers in Electronic Testing, nr. 15

Editat de Benoit Nadeau-Dostie

30 sep 1999

Preț: 925^.37 lei 1128^.50 lei

43-57 zile

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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 16

Editat de Adam Osseiran

31 oct 1999

Preț: 917^.70 lei 1119^.14 lei

43-57 zile

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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Frontiers in Electronic Testing, nr. 17

Autor M. Bushnell et al.

7 apr 2013

Preț: 785^.58 lei 958^.02 lei

43-57 zile

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Frontiers in Electronic Testing, nr. 18

Autor José T. de Sousa et al.

28 feb 2001

Preț: 918^.66 lei 1120^.31 lei

43-57 zile

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A Designer’s Guide to Built-In Self-Test

Frontiers in Electronic Testing, nr. 19

Autor Charles E. Stroud

31 mai 2002

Preț: 1191^.03 lei 1452^.47 lei

43-57 zile

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Test Resource Partitioning for System-on-a-Chip

Frontiers in Electronic Testing, nr. 20

Autor Vikram Iyengar et al.

30 iun 2002

Preț: 626^.03 lei 736^.50 lei

43-57 zile

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Frontiers in Electronic Testing, nr. 21

Autor R. Bartl et al.

Preț: 630^.42 lei 663^.60 lei

Indisponibil temporar

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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Frontiers in Electronic Testing, nr. 21

Autor Krishnendu Chakrabarty

30 sep 2002

Preț: 631^.25 lei 742^.64 lei

43-57 zile

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 22B

Autor Nicola Nicolici et al.

28 feb 2003

Preț: 624^.11 lei 734^.24 lei

43-57 zile

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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Frontiers in Electronic Testing, nr. 22A

Autor R. Dean Adams

26 apr 2013

Preț: 916^.01 lei 1117^.08 lei

43-57 zile

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Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Frontiers in Electronic Testing, nr. 23

Editat de Alfredo Benso et al.

31 oct 2003

Preț: 921^.39 lei 1123^.65 lei

43-57 zile

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Elements of STIL: Principles and Applications of IEEE Std. 1450

Frontiers in Electronic Testing, nr. 24

Autor Gregory A. Maston et al.

31 oct 2003

Preț: 926^.28 lei 1129^.61 lei

43-57 zile

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Verification by Error Modeling: Using Testing Techniques in Hardware Verification

Frontiers in Electronic Testing, nr. 25

Autor Katarzyna Radecka et al.

30 noi 2003

Preț: 626^.67 lei 737^.26 lei

43-57 zile

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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Frontiers in Electronic Testing, nr. 26

Autor Said Hamdioui

31 mar 2004

Preț: 625^.85 lei 736^.30 lei

43-57 zile

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Advances in Electronic Testing: Challenges and Methodologies

Frontiers in Electronic Testing, nr. 27

Editat de Dimitris Gizopoulos

5 dec 2014

Preț: 923^.98 lei 1126^.81 lei

43-57 zile

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Frontiers in Electronic Testing, nr. 28

Autor Dimitris Gizopoulos et al.

20 dec 2004

Preț: 961^.86 lei 1202^.33 lei

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Introduction to Advanced System-on-Chip Test Design and Optimization

Frontiers in Electronic Testing, nr. 29

Autor Erik Larsson

7 noi 2005

Preț: 940^.23 lei 1146^.63 lei

43-57 zile

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Fault Diagnosis of Analog Integrated Circuits

Frontiers in Electronic Testing, nr. 30

Autor Prithviraj Kabisatpathy et al.

7 noi 2005

Preț: 624^.11 lei 734^.24 lei

43-57 zile

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Frontiers in Electronic Testing, nr. 31

Autor Leendert M. Huisman

21 iun 2005

Preț: 627^.62 lei 738^.37 lei

43-57 zile

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Fault-Tolerance Techniques for SRAM-Based FPGAs

Frontiers in Electronic Testing, nr. 32

Autor Fernanda Lima Kastensmidt et al.

14 iun 2006

Preț: 623^.48 lei 733^.51 lei

43-57 zile

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Digital Timing Measurements: From Scopes and Probes to Timing and Jitter

Frontiers in Electronic Testing, nr. 33

Autor Wolfgang Maichen

11 aug 2006

Preț: 923^.69 lei 1126^.44 lei

43-57 zile

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing, nr. 34

Autor Manoj Sachdev et al.

10 noi 2010

Preț: 1184^.43 lei 1444^.43 lei

43-57 zile

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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500™

Frontiers in Electronic Testing, nr. 35

Autor Francisco da Silva et al.

20 oct 2014

Preț: 677^.49 lei 797^.04 lei

43-57 zile

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Oscillation-Based Test in Mixed-Signal Circuits

Frontiers in Electronic Testing, nr. 36

Autor Gloria Huertas Sánchez et al.

6 noi 2006

Preț: 931^.53 lei 1136^.01 lei

43-57 zile

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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability

Frontiers in Electronic Testing, nr. 37

Editat de Mohammad Tehranipoor

10 dec 2007

Preț: 930^.74 lei 1135^.05 lei

43-57 zile

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Timing Performance of Nanometer Digital Circuits Under Process Variations

Frontiers in Electronic Testing, nr. 39

Autor Victor Champac et al.

27 apr 2018

Preț: 707^.42 lei 862^.70 lei

43-57 zile

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Frontiers in Electronic Testing, nr. 40

Autor Andrei Pavlov et al.

21 iun 2008

Preț: 972^.28 lei 1185^.70 lei

43-57 zile

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Soft Errors in Modern Electronic Systems

Frontiers in Electronic Testing, nr. 41

Editat de Michael Nicolaidis

5 noi 2012

Preț: 787^.76 lei 1036^.53 lei

38-44 zile

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Frontiers in Electronic Testing, nr. 42

Autor Michael Gössel et al.

9 mai 2008

Preț: 623^.18 lei 733^.14 lei

43-57 zile

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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault

Frontiers in Electronic Testing, nr. 43

Editat de Hans-Joachim Wunderlich

mar 2012

Preț: 625^.87 lei 782^.34 lei

43-57 zile

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Frontiers in Electronic Testing