Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability: Frontiers in Electronic Testing, cartea 37
Editat de Mohammad Tehranipooren Limba Engleză Hardback – 10 dec 2007
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
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Specificații
ISBN-13: 9780387747460
ISBN-10: 038774746X
Pagini: 405
Ilustrații: XII, 408 p. 200 illus.
Dimensiuni: 155 x 235 x 28 mm
Greutate: 0.81 kg
Ediția:2008
Editura: Springer Us
Colecția Springer
Seria Frontiers in Electronic Testing
Locul publicării:New York, NY, United States
ISBN-10: 038774746X
Pagini: 405
Ilustrații: XII, 408 p. 200 illus.
Dimensiuni: 155 x 235 x 28 mm
Greutate: 0.81 kg
Ediția:2008
Editura: Springer Us
Colecția Springer
Seria Frontiers in Electronic Testing
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
Test and Defect Tolerance for Crossbar-Based Architectures.- Defect-Tolerant Logic with Nanoscale Crossbar Circuits.- Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics.- Test and Defect Tolerance for Reconfigurable Nanoscale Devices.- A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology.- Defect Tolerance in Crossbar Array Nano-Architectures.- Test and Defect Tolerance for QCA Circuits.- Reversible and Testable Circuits for Molecular QCA Design.- Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems.- QCA Circuits for Robust Coplanar Crossing.- Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata.- Testing Microfluidic Biochips.- Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems.- Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips.- Reliability for Nanotechnology Devices.- Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields.- Towards Nanoelectronics Processor Architectures.- Design and Analysis of Fault-Tolerant Molecular Computing Systems.
Textul de pe ultima copertă
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
Caracteristici
Covers various technologies that have been suggested by researchers over the last decades Includes technologies such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), nanowires and carbon nanotubes Discusses different aspects of test and defect tolerance for crossbar-based nanoscale devices Contains five chapters focusing on test, defect tolerance and reliability for QCA circuits Presents methods for testing and diagnosis of realistic defects in digital microfluidic biochips Includes three chapters dealing with the reliability of CMOS scale devices, developing nanoscale processors and future molecular electronics-based circuits Includes supplementary material: sn.pub/extras