Cantitate/Preț
Produs

Introduction to IDDQ Testing: Frontiers in Electronic Testing, cartea 8

Autor S. Chakravarty, Paul J. Thadikaran
en Limba Engleză Hardback – 30 iun 1997
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective.
A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson.
This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers.
Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Citește tot Restrânge

Toate formatele și edițiile

Toate formatele și edițiile Preț Express
Paperback (1) 62983 lei  6-8 săpt.
  Springer Us – 12 oct 2012 62983 lei  6-8 săpt.
Hardback (1) 64057 lei  6-8 săpt.
  Springer Us – 30 iun 1997 64057 lei  6-8 săpt.

Din seria Frontiers in Electronic Testing

Preț: 64057 lei

Preț vechi: 75362 lei
-15% Nou

Puncte Express: 961

Preț estimativ în valută:
12260 12744$ 10156£

Carte tipărită la comandă

Livrare economică 05-19 februarie 25

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9780792399452
ISBN-10: 0792399455
Pagini: 323
Ilustrații: XIX, 323 p.
Dimensiuni: 155 x 235 x 25 mm
Greutate: 0.79 kg
Ediția:1997
Editura: Springer Us
Colecția Springer
Seria Frontiers in Electronic Testing

Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

1 Introduction.- 2 Why IDDQ Testing?.- 3 Putting IDDQ Testing to Work.- 4 Physical Defects.- 5 Test Suites, Fault Models, Test Sets and Defects.- 6 Evaluating IDDQ Tests.- 7 Selecting IDDQ Tests.- 8 Computing IDDQ Tests.- 9 Fault Diagnosis.- 10 Instrumentation for IDDQ Measurement.- References.