Cantitate/Preț
Produs

Materials Characterization Using Nondestructive Evaluation (NDE) Methods: Woodhead Publishing Series in Electronic and Optical Materials

Editat de Gerhard Huebschen, Iris Altpeter, Ralf Tschuncky, Hans-Georg Herrmann
en Limba Engleză Hardback – 5 apr 2016
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures.
Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries.
Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress.


  • Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques
  • Reviews the determination of microstructural and mechanical properties
  • Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries
  • Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Citește tot Restrânge

Din seria Woodhead Publishing Series in Electronic and Optical Materials

Preț: 94204 lei

Preț vechi: 124128 lei
-24% Nou

Puncte Express: 1413

Preț estimativ în valută:
18027 18960$ 15063£

Carte tipărită la comandă

Livrare economică 02-16 ianuarie 25

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9780081000403
ISBN-10: 0081000405
Pagini: 320
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.64 kg
Editura: ELSEVIER SCIENCE
Seria Woodhead Publishing Series in Electronic and Optical Materials


Cuprins

1. Atomic force microscopy (AFM) for materials characterization 2. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization 3. X-ray micro-tomography for materials characterization 4. X-ray diffraction (XRD) techniques for materials characterization 5. Microwave, millimeter wave and terahertz techniques for materials characterization 6. Acoustical microscopy for materials characterization 7. Ultrasonic techniques for materials characterization 8. Electromagnetic techniques for materials characterization 9. Hybrid methods for materials characterization