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Materials Reliability in Microelectronics III: Volume 309 de Kenneth P. Rodbell

Materials Reliability in Microelectronics III: Volume 309: MRS Proceedings

Editat de Kenneth P. Rodbell, William F. Filter, Harold J. Frost, Paul S. Ho
en Limba Engleză Paperback – 4 iun 2014
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
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Specificații

ISBN-13: 9781107409484
ISBN-10: 1107409489
Pagini: 514
Dimensiuni: 152 x 229 x 26 mm
Greutate: 0.68 kg
Editura: Cambridge University Press
Colecția Cambridge University Press
Seria MRS Proceedings

Locul publicării:New York, United States