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Model-based Fault Diagnosis in Dynamic Systems Using Identification Techniques: Advances in Industrial Control

Autor Silvio Simani, Cesare Fantuzzi, Ron J. Patton
en Limba Engleză Hardback – 13 noi 2002
Safety in industrial process and production plants is a concern of rising importance but because the control devices which are now exploited to improve the performance of industrial processes include both sophisticated digital system design techniques and complex hardware, there is a higher probability of failure. Control systems must include automatic supervision of closed-loop operation to detect and isolate malfunctions quickly. A promising method for solving this problem is "analytical redundancy", in which residual signals are obtained and an accurate model of the system mimics real process behaviour. If a fault occurs, the residual signal is used to diagnose and isolate the malfunction. This book focuses on model identification oriented to the analytical approach of fault diagnosis and identification covering: choice of model structure; parameter identification; residual generation; and fault diagnosis and isolation. Sample case studies are used to demonstrate the application of these techniques.
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Specificații

ISBN-13: 9781852336851
ISBN-10: 1852336854
Pagini: 300
Ilustrații: XV, 282 p.
Dimensiuni: 156 x 234 x 22 mm
Greutate: 0.55 kg
Ediția:2002
Editura: SPRINGER LONDON
Colecția Springer
Seria Advances in Industrial Control

Locul publicării:London, United Kingdom

Public țintă

Research

Cuprins

1. Introduction.- 2. Model-based Fault Diagnosis Techniques.- 3. System Identification for Fault Diagnosis.- 4. Residual Generation, Fault Diagnosis and Identification.- 5. Fault Diagnosis Application Studies.- 6. Concluding Remarks.- References.

Textul de pe ultima copertă

Safety in industrial process and production plants is a concern of rising importance, especially if people would be endangered by a catastrophic system failure. On the other hand, because the control devices which are now exploited to improve the overall performance of industrial processes include both sophisticated digital system design techniques and complex hardware (input-output sensors, actuators, components and processing units), there is an increased probability of failure. As a direct consequence of this, control systems must include automatic supervision of closed-loop operation to detect and isolate malfunctions as early as possible.
One of the most promising methods for solving this problem is the "analytical redundancy" approach, in which residual signals are obtained. The basic idea consists of using an accurate model of the system to mimic the real process behaviour. If a fault occurs, the residual signal, i.e., the difference between real system and model behaviours, can be used to diagnose and isolate the malfunction.
This book focuses on model identification oriented to the analytical approach of fault diagnosis and identification. The problem is treated in all its aspects covering:
• choice of model structure;
• parameter identification;
• residual generation;
• fault diagnosis and isolation.
Sample case studies are used to demonstrate the application of these techniques.
Model-based Fault Diagnosis in Dynamic Systems Using Identification Techniques will be of interest to researchers in control and fault identification. Industrial control engineers interested in applying the latest methods in fault diagnosis will benefit from the practical examples and case studies.
 
Advances in Industrial Control aims to report and encourage the transfer of technology in control engineering. The rapid development of control technology has an impact onall areas of the control discipline. The series offers an opportunity for researchers to present an extended exposition of new work in all aspects of industrial control.

Caracteristici

The reader will gain practical knowledge of how to apply the latest models and techniques in fault diagnosis to industrial systems Application of the subject matter will reduce the risk of failure in safety-critical systems Includes supplementary material: sn.pub/extras