Aberration Theory in Electron and Ion Optics: Advances in Imaging and Electron Physics, cartea 226
Editat de Peter W. Hawkes, Martin Hÿtchen Limba Engleză Hardback – 5 iun 2023
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
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Specificații
ISBN-13: 9780443193200
ISBN-10: 0443193207
Pagini: 374
Dimensiuni: 152 x 229 x 25 mm
Greutate: 0.72 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0443193207
Pagini: 374
Dimensiuni: 152 x 229 x 25 mm
Greutate: 0.72 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in generalCuprins
- The electron optical imaging system and its aberrationsJiye Ximen
- The electromagnetic deflection system and its aberrationsJiye Ximen
- The electromagnetic multipole system and its aberrationsJiye Ximen
- The ion optical system and its aberrationsJiye Ximen
- Computer aided design of electron and ion optical systems
Afterword: Life and works of Jiye Ximen
Peter Hawkes