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Aberration Theory in Electron and Ion Optics: Advances in Imaging and Electron Physics, cartea 226

Editat de Peter W. Hawkes, Martin Hÿtch
en Limba Engleză Hardback – 5 iun 2023
Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics series
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Specificații

ISBN-13: 9780443193200
ISBN-10: 0443193207
Pagini: 374
Dimensiuni: 152 x 229 x 25 mm
Greutate: 0.72 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics


Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Cuprins

  1. The electron optical imaging system and its aberrationsJiye Ximen
  2. The electromagnetic deflection system and its aberrationsJiye Ximen
  3. The electromagnetic multipole system and its aberrationsJiye Ximen
  4. The ion optical system and its aberrationsJiye Ximen
  5. Computer aided design of electron and ion optical systems
Jiye Ximen
Afterword: Life and works of Jiye Ximen
Peter Hawkes