Scanning Tunneling Microscopy and Related Methods: NATO Science Series E:, cartea 184
Editat de R.J. Behm, N. García, H. Rohreren Limba Engleză Hardback – 31 aug 1990
Toate formatele și edițiile | Preț | Express |
---|---|---|
Paperback (1) | 1228.15 lei 6-8 săpt. | |
SPRINGER NETHERLANDS – 8 dec 2010 | 1228.15 lei 6-8 săpt. | |
Hardback (1) | 1234.46 lei 6-8 săpt. | |
SPRINGER NETHERLANDS – 31 aug 1990 | 1234.46 lei 6-8 săpt. |
Din seria NATO Science Series E:
- 24% Preț: 1570.65 lei
- Preț: 397.76 lei
- Preț: 386.81 lei
- 20% Preț: 346.24 lei
- Preț: 424.33 lei
- 18% Preț: 1224.18 lei
- 18% Preț: 1836.63 lei
- 18% Preț: 1229.28 lei
- Preț: 381.00 lei
- Preț: 409.30 lei
- 18% Preț: 1841.36 lei
- 5% Preț: 367.28 lei
- Preț: 407.19 lei
- 18% Preț: 1838.38 lei
- Preț: 420.28 lei
- Preț: 399.29 lei
- Preț: 398.74 lei
- 18% Preț: 3026.13 lei
- Preț: 388.90 lei
- 5% Preț: 391.06 lei
- 18% Preț: 1228.62 lei
- 18% Preț: 1229.73 lei
- 18% Preț: 1234.46 lei
- 5% Preț: 3532.05 lei
- 18% Preț: 1840.11 lei
- 5% Preț: 378.80 lei
- 18% Preț: 1227.84 lei
- Preț: 392.75 lei
- Preț: 395.63 lei
- 18% Preț: 2489.30 lei
- 5% Preț: 1429.27 lei
- Preț: 396.02 lei
- 5% Preț: 2142.61 lei
- 18% Preț: 3049.16 lei
- 18% Preț: 1844.54 lei
- Preț: 403.53 lei
Preț: 1234.46 lei
Preț vechi: 1505.44 lei
-18% Nou
Puncte Express: 1852
Preț estimativ în valută:
236.21€ • 247.29$ • 195.45£
236.21€ • 247.29$ • 195.45£
Carte tipărită la comandă
Livrare economică 05-19 aprilie
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9780792308614
ISBN-10: 0792308611
Pagini: 526
Ilustrații: X, 526 p.
Dimensiuni: 156 x 234 x 30 mm
Greutate: 0.93 kg
Ediția:1990
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria NATO Science Series E:
Locul publicării:Dordrecht, Netherlands
ISBN-10: 0792308611
Pagini: 526
Ilustrații: X, 526 p.
Dimensiuni: 156 x 234 x 30 mm
Greutate: 0.93 kg
Ediția:1990
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria NATO Science Series E:
Locul publicării:Dordrecht, Netherlands
Public țintă
ResearchCuprins
I. Methods.- 1) Scanning Tunneling Microscopy — methods and variations.- II. Theory.- 2) A brief introduction to tunneling theory.- 3) Tunneling times for one-dimensional barriers.- 4) Theory of Scanning Tunneling Microscopy and Spectroscopy.- 5) Theory of tunneling from transition metal tips.- 6) Tip-surface interactions.- 7) On the quantized conductance of small contacts.- 8) Adiabatic evolution and resonant tunneling through a one-dimensional constriction.- 9) What do we mean by ‘work function’.- III. Applications of STM at Solid State Surfaces.- 10) Scanning Tunneling Microscopy: Metal surfaces, adsorption and surface reactions.- 11) Scanning Tunneling Microscopy: Semiconductor surfaces, adsorption and epitaxy.- 12) Spectroscopy using conduction electrons.- 13) Scanning Tunneling Optical Microscopy (STOM) of silver nanostructures.- 14) Surface modification with the STM and the AFM.- IV. Liquid-Solid Interface.- 15) Scanning Probe Microscopy of liquid-solid interfaces.- 16) In-situ Scanning Tunneling Microscopy in electrochemistry.- V. Applications of STM at Organic and Biological Materials.- 17) Imaging and conductivity of biological and organic material.- 18) Study of the biocompatibility of surgical implant materials at the atomic and molecular level using Scanning Tunneling Microscopy.- 19) Naked DNA helicity observed by Scanning Tunneling Microscopy.- 20) Applications of Scanning Tunneling Microscopy to layered materials, organic charge transfer complexes and conductive polymers.- 21) Electron túnneling through a molecule.- 22) Electronic transport in disordered organic chains.- VI. Electron and Ion Point Sources.- 23) Electron and ion point sources, properties and applications.- 24) Field electron emission from atomic-size microtips.- VII. ForceMicroscopy.- 25) Force Microscopy.- 26) Electret-condensor-microphone used as a very sensitive force sensor.- VIII. Optical and Acoustic Microscopy.- 27) Resolution and contrast generation in Scanning Near-Field Optical Microscopy.- 28) Scanning Tunneling Optical Microscopy.- 29) Scanning Near-Field Acoustic Microscopy.