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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies de Alberto Bosio

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Autor Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
en Limba Engleză Paperback – 3 sep 2014
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.
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Specificații

ISBN-13: 9781489983145
ISBN-10: 1489983147
Pagini: 188
Ilustrații: XV, 171 p.
Dimensiuni: 155 x 235 x 10 mm
Greutate: 0.27 kg
Ediția:2010
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

Basics on SRAM Testing.- Resistive-Open Defects in Core-Cells.- Resistive-Open Defects in Pre-charge Circuits.- Resistive-Open Defects in Address Decoders.- Resistive-Open Defects in Write Drivers.- Resistive-Open Defects in Sense Amplifiers.- Faults Due to Process Variations in SRAMs.- Diagnosis and Design-for-Diagnosis.

Textul de pe ultima copertă

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by:
Alberto Bosio
Luigi Dilillo
Patrick Girard
Serge Pravossoudovitch
Arnaud Virazel
Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book.
  • First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories;
  • Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies;
  • Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.);
  • Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.

Caracteristici

First book to present complete, state-of-the-art coverage of dynamic fault memory testing Presents content using a "bottom-up" approach, from the electrical causes of malfunction up to the generation of smart test strategies Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.) Includes Spice simulation files and an SRAM logic fault simulator Includes supplementary material: sn.pub/extras