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Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 229

Peter W. Hawkes, Martin Hÿtch
en Limba Engleză Hardback – 3 apr 2024
Advances in Imaging and Electron Physics, Volume 229 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics series
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Specificații

ISBN-13: 9780443296482
ISBN-10: 0443296480
Pagini: 888
Dimensiuni: 152 x 229 x 11 mm
Greutate: 0.28 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics


Cuprins

The contributors in this volume include:
1. Sameen Ahmed Khan
2. Ramaswamy Jagannathan